Wang ,Chu Kia <br/><br/>
VLSI test principles and architectures 

 - NA 
 - New Delhi:  New Age International (Pvt) Limited  ,2013. 
 - xxi,678p.  0  Original 
<br/><br/> Includes Index 
<br/><br/><label>ISBN: </label>NA 
<br/><br/><label>Subjects--Personal Names: </label><br/>Engineering Technology
<br/><br/><label>Subjects--Topical Terms: </label><br/>Technology
<br/><br/><label>Dewey Class. No.: </label>621.395 WAN