00614nam a2200193Ia 4500008004100000020001400041082001700055100001700072245004800089250000700137260004400144300003000188500001900218600002700237650001500264942000700279952011900286999001500405240925s9999    xx            000 0 und d  a750694726  a621.3815 AFS  aAfshar ,Amir 0aPrinciples of Semiconductor Network Testing  aNA  aBoston:bButterworth- Heinemannc,1995.  axxvii,433p.bNAfOriginal  aIncludes Index  aElectronic Engineering  aTechnology  cBK  001040708ELaUITUbUITUd2000-01-13eMr..Mohiuodinl0o621.3815 AFSpQ2183r2024-09-25 07:12:41w2024-09-25yBK  c4682d4682