<?xml version="1.0" encoding="utf-8" ?> <rss version="2.0" xmlns:opensearch="http://a9.com/-/spec/opensearch/1.1/" xmlns:dc="http://purl.org/dc/elements/1.1/" xmlns:atom="http://www.w3.org/2005/Atom"> <channel> <title> <![CDATA[UIT University Search for 'Provider:Marcel Dekker']]> </title> <link> /cgi-bin/koha/opac-search.pl?q=ccl=Provider%3AMarcel%20Dekker&#38;sort_by=relevance&#38;format=rss </link> <atom:link rel="self" type="application/rss+xml" href="/cgi-bin/koha/opac-search.pl?q=ccl=Provider%3AMarcel%20Dekker&#38;sort_by=relevance&#38;format=rss"/> <description> <![CDATA[ Search results for 'Provider:Marcel Dekker' at UIT University]]> </description> <opensearch:totalResults>5</opensearch:totalResults> <opensearch:startIndex>0</opensearch:startIndex> <opensearch:itemsPerPage>50</opensearch:itemsPerPage> <atom:link rel="search" type="application/opensearchdescription+xml" href="/cgi-bin/koha/opac-search.pl?q=ccl=Provider%3AMarcel%20Dekker&#38;sort_by=relevance&#38;format=opensearchdescription"/> <opensearch:Query role="request" searchTerms="q%3Dccl%3DProvider%253AMarcel%2520Dekker" startPage="" /> <item> <title> Optical Strorage and retrival: memory, neural networks, and fractals </title> <dc:identifier>ISBN:824797078</dc:identifier> <link>/cgi-bin/koha/opac-detail.pl?biblionumber=4853</link> <description> <![CDATA[ <p> By Not - Available.<br /> New York: Marcel Dekker Inc 1987 .<br /> xii,152p. , Includes Index 824797078 </p> ]]> <![CDATA[ <p> <a href="/cgi-bin/koha/opac-reserve.pl?biblionumber=4853">Place hold on <em>Optical Strorage and retrival: memory, neural networks, and fractals</em></a> </p> ]]> </description> <guid>/cgi-bin/koha/opac-detail.pl?biblionumber=4853</guid> </item> <item> <title> Computer Integrated Electronics Manufacturing and Testing </title> <dc:identifier>ISBN:824778499</dc:identifier> <link>/cgi-bin/koha/opac-detail.pl?biblionumber=4418</link> <description> <![CDATA[ <p> By Arabian, Jack.<br /> New York: Marcel Dekker Inc 1989 .<br /> xix,817p. , Includes Index 824778499 </p> ]]> <![CDATA[ <p> <a href="/cgi-bin/koha/opac-reserve.pl?biblionumber=4418">Place hold on <em>Computer Integrated Electronics Manufacturing and Testing</em></a> </p> ]]> </description> <guid>/cgi-bin/koha/opac-detail.pl?biblionumber=4418</guid> </item> <item> <title> Applied Control: current trends &amp; modern methodologies </title> <dc:identifier>ISBN:824788001</dc:identifier> <link>/cgi-bin/koha/opac-detail.pl?biblionumber=4417</link> <description> <![CDATA[ <p> By Not - Available.<br /> New York: Marcel Dekker Inc .<br /> 314p. , Includes Index 824788001 </p> ]]> <![CDATA[ <p> <a href="/cgi-bin/koha/opac-reserve.pl?biblionumber=4417">Place hold on <em>Applied Control: current trends &amp; modern methodologies</em></a> </p> ]]> </description> <guid>/cgi-bin/koha/opac-detail.pl?biblionumber=4417</guid> </item> <item> <title> Electronic Devices and Circuits </title> <dc:identifier>ISBN:NA</dc:identifier> <link>/cgi-bin/koha/opac-detail.pl?biblionumber=3156</link> <description> <![CDATA[ <p> By Bogarat ,Theodore F..<br /> New York: Marcel Dekker Inc 1992 .<br /> 933p. , Includes Index NA </p> ]]> <![CDATA[ <p> <a href="/cgi-bin/koha/opac-reserve.pl?biblionumber=3156">Place hold on <em>Electronic Devices and Circuits </em></a> </p> ]]> </description> <guid>/cgi-bin/koha/opac-detail.pl?biblionumber=3156</guid> </item> <item> <title> Electrical Power Equipment Maintenance and Testing </title> <dc:identifier>ISBN:824799070</dc:identifier> <link>/cgi-bin/koha/opac-detail.pl?biblionumber=13387</link> <description> <![CDATA[ <p> By Gill, Paul.<br /> New York: Marcel Dekker 1998 .<br /> 380p. , Includes Index 824799070 </p> ]]> <![CDATA[ <p> <a href="/cgi-bin/koha/opac-reserve.pl?biblionumber=13387">Place hold on <em>Electrical Power Equipment Maintenance and Testing</em></a> </p> ]]> </description> <guid>/cgi-bin/koha/opac-detail.pl?biblionumber=13387</guid> </item> </channel> </rss>
