| 000 | 00468nam a2200181Ia 4500 | ||
|---|---|---|---|
| 008 | 240925s9999 xx 000 0 und d | ||
| 020 | _a134988663 | ||
| 082 | _a621.395 FEU | ||
| 100 | _aFeugate ,Robert J. | ||
| 245 | 0 | _aIntroduction to VLSI testing | |
| 250 | _aNA | ||
| 260 |
_aNew Jersey: _bPrintice- Hall Int. _c,1988. |
||
| 300 |
_a791p. _bNA _fOriginal |
||
| 500 | _aIncludes Index | ||
| 600 | _aElectronic Engineering | ||
| 650 | _aTechnology | ||
| 942 | _cBK | ||
| 999 |
_c4295 _d4295 |
||